SJ / Z9154.1-87 (IEC444-1 (1986)) with π Network Zero Phase Measurement of quartz crystal unit parameters of the first part, frequency and resonance resistance measurement
 

     SJ / Z9154.2-87 (IEC444-2) (1980) with π Network Zero Phase Measurement of quartz crystal unit parameters of the second part, a dynamic phase offset capacitance measurement
 

     SJ / Z9154.3-87 (IEC444-3) Measurement of quartz crystal unit parameters - Part III by π Network Zero Phase, there are π-type network using measurement frequency and phase compensation capacitance C0 at both ends of the quartz crystal element of 200MHz network measurement parameters
 

     SJ / T11212-1999 (IEC444-69 (1995)) Measurement of quartz crystal unit parameters - Part 6 excitation level correlation (DLD) measurements
 

     IEC68-2 second part of various test environment test
 

     GB2423 electric and electronic products environmental testing standards
 

     GJB360A-1996 (MIL-STD-202F) test methods for electronic and electrical components
 

     MIL-STD-883 test methods and procedures for microelectronic devices